Programma

In this course we shall introduce two experimental techniques used to characterize the surface properties of condensed matter: x-ray photoemission spectroscopy (XPS) and atomic force microscopy (AFM). First, we shall provide a theoretical background of the two techniques. The frontal lectures have the following subjects: optical versus scanning probe microscopy; STM; contact AFM; non-contact AFM; secondary SPM techniques; resolution and artifacts; SPM image analysis; surface and vacuum; fundamental of XPS; three-step model; x-ray sources; electron analyzers; electron detection; XPS data acquisition and analysis. Subsequently, the experimental activity will be carried on using tools available at the Laboratory for Physics and Technology of Semiconductors and at Lasec Laboratory.

Testi Adottati

- Notes provided by the teacher based on the slides presented during the lectures
- Fundamentals of probe scanning microscopy, V. L. Mironov, NT-MDT

Modalità Erogazione

Theory lectrures in classroom and hands on training in laboratory

Modalità Frequenza

Attendance at theory lessons is strongly recommended. Attendance of laboratory exercises is mandatory

Modalità Valutazione

final oral examination and evaluation of the lab book

Programma

In this course we shall introduce two experimental techniques used to characterize the surface properties of condensed matter: x-ray photoemission spectroscopy (XPS) and atomic force microscopy (AFM). First, we shall provide a theoretical background of the two techniques. The frontal lectures have the following subjects: optical versus scanning probe microscopy; STM; contact AFM; non-contact AFM; secondary SPM techniques; resolution and artifacts; SPM image analysis; surface and vacuum; fundamental of XPS; three-step model; x-ray sources; electron analyzers; electron detection; XPS data acquisition and analysis. Subsequently, the experimental activity will be carried on using tools available at the Laboratory for Physics and Technology of Semiconductors.

Testi Adottati

- Notes provided by the teacher based on the slides presented during the lectures
- Fundamentals of probe scanning microscopy, V. L. Mironov, NT-MDT

Modalità Erogazione

Theory lectrures in classroom and hands on training in laboratory

Modalità Frequenza

Attendance at theoretical lectures in person is optional but strongly recommended. Attendance at laboratory experiences is mandatory.

Modalità Valutazione

final oral examination and evaluation of the lab book

Programma

The course provides students with a theoretical and experimental introduction to diagnostic techniques based on the interaction of radiation and particles with matter. Activities will take place at the LASR3 – Surface Analysis Laboratory, INFN Roma Tre Section, with experiments carried out on inorganic and organic materials of interest for semiconductor and superconductor physics, as well as for applications in nuclear physics, medical physics, and advanced sensor development.
Topics covered include:
Radiation–matter interaction: principles of X-ray fluorescence (XRF); applications in the non-destructive study of complex materials.
Particle–matter interaction: principles of sputtering and ion bombardment; ion-induced surface modifications; characterization techniques using ion beams.
Applications: diagnostics of semiconductor and superconductor materials; characterization of materials for medical physics, nuclear physics, and advanced sensor technologies.

Testi Adottati

Handouts provided by the instructor, based on the material presented during lectures.

Modalità Frequenza

Attendance at laboratory activities is mandatory.

Modalità Valutazione

Final oral exam, based on the discussion of the experiments carried out and the submission of a laboratory notebook.